VisionGauge Semiconductor Wafer Inspection and Automated Flaw Detection

VisionGauge Semiconductor Wafer Inspection and Automated Flaw Detection

 

Our VisionGauge® Online Automated Optical Inspections Systems (AOI Systems) are high accuracy tools for automated defect detection, measurement, and inspection. In the semiconductor manufacturing industry, thorough final inspection of wafers is a critical part of the production process; our AOI systems are designed to help you obtain the best results possible.

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VisionGauge Digital Optical Comparators / Profile Projectors

VisionGauge Digital Optical Comparators / Profile Projectors

 

VisionGauge® Digital Optical Comparator / Profile Projector systems allow you to quickly, easily and very accurately compare a part with its CAD drawing.

And while traditional optical comparators require an overlay (i.e. a template or transparency), with the VisionGauge® Digital Optical Comparator everything is done electronically so that there are no more templates! You will never again have to buy, print, calibrate, verify, identify, trace, manage, and physically store & retrieve another template. No more template-related costs, delays or errors. The VisionGauge® Digital Optical Comparator works directly with the CAD data.

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