metrology Archives - Machine Vision

MVTec Software Interfaces to Lumenera Cameras

Juli 25, 2006 Lutz Kreutzer 2236 Views3D calibration, blob analysis, HALCON, indistrial usb camera, lumenera, machine vision, metrology, morphology, mvtec, pattern matching, stereo vision

MVTec Software GmbH, Munich, Germany launches the HALCON LuCam interface to run the powerful HALCON software library for machine vision with Lumenera’s complete line of industrial USB 2.0 cameras

Halcon7.1